See the equipment, meet the people and learn techniques used to examine electronic failure
ITT Failure Analysis Lab Tour
Consider how this information could assist you, your company, a friend. We are limited to only 24 individuals so register early. Only US CITIZENS are able to enter this facility. Cameras, cell phones or any recording device are prohibited in the facility.
Register with a friend by April 20, 2006
by emailing Chairperson@ieeefortwayne.org
Date: April 27, 2006
Dinner 5:30- 6:45
Tour 7:15
Dinner 5:30- 6:45
Tour 7:15
Location: Tour
ITT Summit Park Plant
7310 Innovation Drive
Fort Wayne, IN 46825
ITT Summit Park Plant
7310 Innovation Drive
Fort Wayne, IN 46825
We will meet at O'Charley's in front of Lowes for dinner.
Product relaibility is vital to our customers and the survival of our businesses. Come see how electronic reliability specialists analyzes electronic assembly and component failures.
The lab has just received a new Hitachi S-3400 II Variable Pressure Scanning Electron Microscope that they will demonstrate and explain how it unviels critical information at the micron level of electronic components.
